Sistem Informasi Kepegawaian

Validating The Reliability Simulation Using Bohlamp Circuit With Accelerated Life Test Method

NIP Peneliti

195905271990031002

Nama Peneliti

Prof. Dr. Ir. Bagus Wahyudi, M.T.

Kategori

JURNAL

Judul

Validating the Reliability Simulation Using Bohlamp Circuit with Accelerated Life Test Method

Alamat Jurnal (Halaman ini)

https://simpeg.polinema.ac.id/peer_review/data/jurnal/2022/validating-the-reliability-simulation-using-bohlamp-circuit-with-accelerated-life-test-method

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https://simpeg.polinema.ac.id/upload_dir/fileReview/131884456/buktikorespondensidenganeditormmepjournal.pdf

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